Infrastructure
List of Labs
| Sr. No | Lab |
|---|---|
| 1 | Thin film Laboratory |
| 2 | Nano Materials & Devices Laboratory |
| 3 | Magnetic Materials Laboratory |
| 4 | Polymers & Nanomaterials Research Laboratory |
| 5 | Solar cell Laboratory |
| 6 | Glass Laboratory |
| 7 | Solid State Ionics Laboratory |
| 8 | Theoretical Physics, Mathematical Physics and Quantum Computing Laboratory |
| 9 | Computational Condensed Matter Physics Laboratory |
| 10 | Advanced Functional Materials Laboratory |
Laboratories Details
| Sr. No. | Lab | Details |
|---|---|---|
| 1 | Materials Science Laboratory | Experiments based on conductivity, superconductivity, dielectric properties, semiconductors and magnetic materials, Photoluminescence set-up |
| 2 | Solid State Ionic Laboratory | Dilatometer, High temperature furnace, High resolution dielectric analyzer, Electrometer , Abbe Refractometer, Spectrophotometer |
| 3 | Polymer Nanotech laboratory | Magnetic stirrer, Hot air oven, Muffle furnace (1200 oC), Centrifuge, Pellet making Machine. distillation plant, Centrifuge |
| 4 | Nano Materials and Device Laboratory | Spin coating set-up, distillation plant, Microwave oven, Centrifuge, Digital power supply and current meter, Contact-angle measurement, Digital balance |
| 5 | Thin Film Laboratory | Vacuum coating unit |
| 6 | Computing Laboratory | Machines for computing (Windows/Linux) |
| 7 | Quantum Computing Laboratory and Theoretical Physics | Quantum Computing, Theoretical Physics, Mathematical Physics |
| 8 | Computational Condensed Matter Physics Laboratory | Electronic Structure Calculation of Material Properties |
| 9 | Advanced Functional Materials Laboratory | Synthesis and Characterization of Functional Materials |
Major Laboratory Facilities
| Sr. No. | other Facilities |
|---|---|
| 1 | LASER demonstration experiments |
| 2 | B-H curve tracer |
| 3 | Dilatometer ( Orton) to determine coefficient of thermal expansion |
| 4 | Visible spectrophotometer. |
| 5 | Abbe Refractometer |
| 6 | Alfa analyzer ( Novocontrol) for complex impedance analysis |
| 7 | Electronic balance (Denver) |
| 8 | LCR meter (Hioki) |
| 9 | Fluorescence Spectrophotometer. |
| 10 | High temperature (1400oC) programmable furnace |
| 11 | Computing Lab |
Raman Spectrometer Specifications
Make: NOST (Korea)
Model: HEDA-URSM4/5/7
Excitation Laser Sources: a) 457nm, b) 532nm, c) 785nm
Detector: CCD
Microscope: Olympus microscope (Magnification – 5X, 20X, and 100X)
Gratings: a) 600 gr/mm (spectral range- 0 to 3600cm-1)
b) 1200 gr/mm (spectral range- 0 to 1800 cm-1)
c) 2400 gr/mm (spectral range- 0 to1400 cm-1)
Sample Requirement:
1. Sample Nature: Powder Sample, Solid Sample, Pallets, Thin Films.
2. Sample Requirement: 20 mg powder Sample, (0.5 cm X 0.5 cm) Thin film or Solid sample.
- Click here for Proforma_Annexure 2A
- Click here for Form for requisition of Raman Characterization
Charges for Raman Characterization:-
| Sr.no | Category | Rate per Slot ( Rs) |
| 1 | VNIT Staff and Students | 400/- |
| 2 | Outside VNIT Staff and Students | 800/- |
| 3 | R & D Laboratories | 1600/- |
| 4 | Industries | 2400/- |
GST will be charged 18% extra except for VNIT Staff and Students.
For Details, Please Contact : Mrs. Vijaya Deshmukh
Email ID : vijayadeshmukh2812@gmail.com
Ph. No. : 9881791226
Rigaku Smart lab SE
- Instrumental Details:
Make: Rigaku Japan, Indian Dealer:-IR technology service Pvt Ltd, Navi Mumbai
Model/ Mfd. By: X-Ray Diffractometer Smart lab SE 3KW, Rigaku Corporation Japan
Sr. No: BD70000189-01
- This high-resolution X-Ray diffractometer is used for characterization of powder, thin film, and solid samples. It measures following parameters:
· Omega 2-theta scan
· Reciprocal space map
· Reflectometry
· In-plane diffraction
· Grazing incidence measurements
· Texture measurements
· Residual stress measurements
- Specifications:
X-Ray Source: It has 3 kW (upto 50 kV, 60 mA) solid state X-Ray generator.
X-Ray Tube: Anode-Cu sealed type, Ceramic insulation, long fine focused with high resolution type.
Optics: A combination of parabolic multigraded mirror.
Slits: Single crystal scatter less slits (S1, S2)
Detector: Hybrid pixel-400 (2D HPAD) array detector. Solid state area detector for fast reciprocal space maps with static and dynamic scanning.
Goniometer: The base of goniometer is independent of theta -2 theta or theta/theta decouple.
Fully automated thin film sample stage cradle: High resolution, triple axis, texture, stress, phase and reflectivity measurements with all axes.
Sample platform: Mounting platform for stable and clean mounting of thin flat samples of diameter 2 mm x 2 mm to 4 inch.
SAXS: For determination of particle size for nano materials with transmission optics.
High temperature attachment: Room temperature to 1300°C even in vacuum
Software: Smart lab-II
- Accessories:
· X-Ray tube, Cu
· SE part box
· Bypass valve
· SAXS attachment
· PB collimator holder, HS
· Collimator
· PSA 0.228 S
- Click here for Proforma_Annexure 2A
- Click here for Form for requisition of XRD Characterization
| Sr.no. | Category | Rate per Sample ( Rs) | |
| Normal Scan For Powder / Thin Films* | Slow Scan or Grazing Incidence ** | ||
| 1 | VNIT Staff and Students | 500/- | 1000/- |
| 2 | Staff and Students Outside VNIT | 1000/- | 2000/- |
| 3 | R & D Laboratories | 1600/- | 3000/- |
| 4 | Industries | 4000/- | 6000/- |
*Normal Scan 2oper minute and **Slow Scan less than 2oupto 1o per minute
GST will be charged 18% extra except for VNIT Staff and Students.
For Details, Please Contact : Mrs. Vijaya Deshmukh
Email ID : vijayadeshmukh2812@gmail.com
Ph. No. : 9881791226